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TGA, DSC, AFM, DMA, UV-Vis, FTIR

technologies_lab

CeNTI is outfitted state of the art competences and technologies in what concerns materials characterization and assessment, in almost every fields.

This assessment area focuses the following type of characterization:

  • Morphological
  • Thermal
  • Chemical
  • Electrical

CeNTI technologies for materials characterization are listed below:

  •  SPM - Scanning Probe Microscope including Atomic Force Microscopy (AFM), Piezo Force Microscopy (PFM), Magnetic Force Microscopy (MFM), Nanoindentation, with environmental/ temperature control and liquid handling
  • DMA - Dynamic Mechanical Analyser
  • DSC - Differential Scanning Calorimeter with modulated DSC capabilities
  • FTIR/ATR - Fourier Transform Infrared Spectrophotometer with attenuated total reflectance
  • Capillary Rheometer
  • Optical Microscope with temperature control
  • TGA - Thermogravimetric Analyser
  • UV-VIS - Ultraviolet-Visible Spectrophotometer
  • Melt Flow Indexer
  • Helium Mass Spectrometer
  • Potentiostat/Galvanostat

 

technologies_lab2

These technologies pursue the following outputs:

  • Morphological, structural, thermal, mechanical and rheological properties
  • Dielectric, ferroelectric, piezoelectric and optical properties
  • Resistivity, Capacitance, Impedance, CV and Hysteresis measurements in semiconductor, conductor and dielectric materials
  • Conductor and semiconductor characterisation
  • Nanoscale electrical, piezoelectric and magnetic properties
  • Sensor, Electronic and Optoelectronic device characterization